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ellipsometry
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thin film measurement
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  1. Axic Inc - Semiconductor Plasma, Rapid Thermal Processing and Thin Film Metrology Equipment Company Homepage

    AXIC, Inc manufactures and distributes semiconductor plasma processing equipment and Thin Film Metrology tools (Ellipsometer, Spectroscopic and Discrete ...
    Asher1
    PECVD1
    Thickness Measurement1
    Plasma etcher1
    refractive index1
    Reflectometer1
    ellipsometer1
    optical measurement1
    LPCVD1
    ellipsometry1
    Plasma etch1
    Spectroscopic Ellipsometry1
    Thin Film Measurement1
    Spectroscopic Ellipsometer1
    Thin Film Metrology1
    Photoresist stripping1
    Reactive ion etch1
    Plasma deposition1
    Rapid thermal annealing1
    Reactive ion etcher1
    Thin Film Analysis1
    Rapid thermal anneal1
    Resist stripper1
    X-ray fluoresence1
    Diode etcher0
    ICP etch0
    ICP etcher0
    ICP PECVD0
    Photoresist stripper0
    Plasma wafer backside thinning0
    Rapid thermal processor0

    www.axic.com - 2009-02-07

  2. Filmetrics Thin Film Thickness Measurements, Thin Film Measurements

    Home About Us Technology Spectral Reflectance What We Measure Products Overview F10 F20 F30 F40/F42 F50/F60 F80 Accessories Applications Biomedical Displays ...
    map3
    polymer2
    semiconductor2
    gauge2
    process control2
    measure2
    layer1
    wafer1
    oxide1
    CMP1
    CVD1
    spectrometer1
    in-line1
    in-situ1
    polyimide1
    nitride1
    interferometry1
    photoresist1
    polysilicon1
    thickness measurement1
    uniformity1
    refractive index1
    ellipsometry1
    optical properties1
    thin film measurement1
    optical constants1
    integrated metrology1
    spectral reflectance1
    oxynitride1
    a-silicon1
    defect mapping1

    www.filmetrics-asia.com - 2009-02-13

  3. Filmetrics Thin Film Thickness Measurements, Thin Film Measurements

    Home About Us Technology Spectral Reflectance What We Measure Products Overview F10 F20 F30/F37 F40/F42 F50/F60 F80 Accessories Applications Biomedical Displays ...
    map3
    polymer2
    semiconductor2
    gauge2
    process control2
    measure2
    layer1
    wafer1
    oxide1
    CMP1
    CVD1
    spectrometer1
    in-line1
    in-situ1
    polyimide1
    nitride1
    interferometry1
    photoresist1
    polysilicon1
    thickness measurement1
    uniformity1
    refractive index1
    ellipsometry1
    optical properties1
    thin film measurement1
    optical constants1
    integrated metrology1
    spectral reflectance1
    oxynitride1
    a-silicon1
    defect mapping1

    www.filmetricseuropa.com - 2009-04-02

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